67
/100
C
◐ Assessed 3⁄3
wafer-map-mcp
Exposes semiconductor wafer analysis tools including wafer maps, P-charts, and statistical plots, enabling AI assistants to visualize and analyze wafer test data.
Glama
Assessed visibility
— 3/3 applicable dimensions scored
✓ Schema Quality
— Protocol
— Reliability
✓ Docs & Maintenance
✓ Security Hygiene
— Schema Interpretability
Schema Quality
60
42% weight
Protocol Compliance
N/A
Local server
Reliability
N/A
Local server
Docs & Maintenance
43
25% weight
Security Hygiene
95
33% weight
Score History
Category Trends
Static Analysis
| Metric | Score | Rating |
|---|---|---|
| Schema Completeness | 60 | Fair |
| Description Quality | 60 | Fair |
| Documentation Coverage | 35 | Poor |
| Maintenance Pulse | 45 | Fair |
| Dependency Health | 30 | Poor |
| License Clarity | 100 | Good |
| Version Hygiene | — | Poor |
Analyzed 9 hours, 21 minutes ago
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